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Device Information
Device Name
X-ray diffraction (XRD)
Model
JEOL (JDX-9C)
Units Available
1
Manufacture Year
Manufacturer Website
Description
X-Ray Diffraction System is a versatile, non-destructive analytical technique used for the identification and quantitative determination of a wide range of materials; stones, powders, thin films, sheets, and metals, giving great and ideal information in their elemental composition, chemical and crystalline structure. The unit serves the faculties of Science, Pharmacy, Agriculture, and Fine Arts, in addition to cement factories and quarries. The unit offers its services to all researchers in various fields at scientific colleges, research centers, and industrial institutions.
Services & Pricing
Service | Cost |
---|---|
X-ray diffraction (XRD) analysis for one sample | 150/200 EGP |
X-ray diffraction (XRD) analysis for one sample | 100/125 EGP |