Device information
-
Name: Thin film surface profiler model F20EXR with contact probe CP-1-1.3.Model: ***Num of units: 1
-
Manufacture Year:
-
Description: -Thickness and refractive index can be measured in less than a second.
-
Availability: available
-
ServicesCost--
-
Total Cost0
For more info and reservation contact:
- Lab Person
- Dr.Marwa Mansour
- 01008089280
- University Coordinator
- Electronics Research Institute
- info@eri.sci.eg
- 00226252700