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Device Information
Device Name
Scan Electron Microscope
Model
JSM-T100
Units Available
1
Manufacture Year
0000-00-00
Manufacturer Website
Description
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition.
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