Device information
-
Name: Scanning Electron MicroscopeModel: JSM-6010LVNum of units: 1
-
Manufacture Year: 0000-00-00Manufacturer Website: http://www.jeol.co.jp/en/
-
Description: Microscopic Analysis and Characterization of materials
-
Availability: available
-
ServicesCost--
-
Total Cost0
For more info and reservation contact:
- Lab Staff
- Eng. Diana Serag
- 01093093494
- Faculty Coordinator
- Prof. Matsushita
- matsushita@ejust.edu.eg
- 001000000000
- University Coordinator
- أ.د. محمد جبريل
- mohamed.gepreel@ejust.edu.eg
- 01147375539