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Device Information
Device Name
Atomic Force Microscopy
Model
SSM-14N5E
Units Available
1
Manufacture Year
2000
Manufacturer Website
Description
The Atomic Force Microscope (AFM) is a high-resolution scanning probe microscope used to image, measure, and manipulate surfaces at the nanoscale down to atomic resolution. It works by scanning a sharp probe (cantilever with a nanometer-scale tip) over the surface of a sample and detecting deflections caused by interatomic forces between the tip and sample. AFM is widely applied across materials science, nanotechnology, semiconductor research, biology, and surface physics for measuring surface topography, mechanical properties, adhesion, friction, and electrical properties with nanometer or better precision.
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Additional Information
Operating Principle: Scanning a nanoscale tip over a sample surface to detect forces and map surface features. Scanning Modes: Contact mode, tapping/intermittent mode, lateral force, force spectroscopy, and other SPM techniques depending on system capabil