Laboratory Equipment Details
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Device Information
Device Name
Scanning Electron Microscope
Model
ZEISS
Units Available
1
Manufacture Year
Manufacturer Website
Description
advanced imaging instrument that scans a sample with a focused electron beam to produce highly detailed images of its surface topography and composition at nanoscale resolution. ZEISS SEMs are widely used in materials science, engineering, biology, geology, and industrial quality control for precise structural and elemental analysis
Services & Pricing
| Service | Cost |
|---|---|
| High-resolution surface imaging Microstructure and morphology analysis Particle size and shape analysis Elemental analysis (EDS/EDX | 700 EGP |
Additional Information
advanced imaging instrument that scans a sample with a focused electron beam to produce highly detailed images of its surface topography and composition at nanoscale resolution. ZEISS SEMs are widely used in materials science, engineering, biology, geolog