Laboratory Equipment Details
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Device Information
Device Name
Scanning Electron Microscope
Model
ZEISS
Units Available
1
Manufacture Year
2024
Manufacturer Website
Description
https://sci.sohag-univ.edu.eg/main/%D9%88%D8%AD%D8%AF%D8%A9-%D8%A7%D9%84%D9%85%D9%8A%D9%83%D8%B1%D9%88%D8%B3%D9%83%D9%88%D8%A8-%D8%A7%D9%84%D8%A7%D9%84%D9%83%D8%AA%D8%B1%D9%88%D9%86%D9%8A/
Services & Pricing
| Service | Cost |
|---|---|
| High-resolution surface imaging Microstructure and morphology analysis Particle size and shape analysis Elemental analysis (EDS/EDX | 700 EGP |
Additional Information
advanced imaging instrument that scans a sample with a focused electron beam to produce highly detailed images of its surface topography and composition at nanoscale resolution. ZEISS SEMs are widely used in materials science, engineering, biology, geolog